Description
XO/VCXO/TCXO Full-Temperature Test System
Key Features
- Simultaneous frequency acquisition
- Zero-dead-time readings
- Independent counter per channel
- Five-Card Backplane
- 8 or 16 DUTs per card
- DIN connectors for robust swapping
- Enables wider testing capability:
- ADEV
- Trim Effect
- Warm-up
- Microjumps
- Thermal Hysteresis
Applications
- Enables temperature qualification of systems based on precision timing including: GPS, Radar, Radios, Guided Munitions, SATCOM, Cellular Infrastructure, Stratum-Compliant Devices, SARSAT, Test Instrumentation, Quantum Computing, A.I. Data Centers, and more.
- Ideal for OCXO manufacturers to test the majority of frequency-based parameters such as frequency vs. temperature, ADEV, and warm-up at production volumes
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